Acknowledgements 

The authors, Wayne Jansen from NIST and Miles Tracy and Mark McLarnon from Booz 

Allen wish to express their thanks to colleagues at both organizations who reviewed drafts of 

this document.  In particular, their appreciation goes to John Wack, Murugiah Souppaya, and 

Tim Grance from NIST, and Steve Allison, Scott Bisker, Alexis Feringa, Kevin Kuhlkin, and 

Jonathan Holleran of Booz Allen, for their research, technical support, and written 

contributions to this document.  The authors would also like to express their thanks to all those 

who contributed input during the public comment period and who assisted with our internal 

review process.  

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